Optical Metrology Solutions
Kevin Harding has almost 40 years of experience in the area of optical instrumentation, machine vision, and optical metrology. At GE Research for almost 19 years, he led the activity in Optical Metrology doing work for the many businesses of GE including application in healthcare to turbines. In 2017 Kevin retired from GE as a Principal Scientist, covering technologies as diverse as solar cells to biometrics. Kevin Harding is internationally recognized for his expertise in 3D measurement technology, and has been recognized for this work by many organizations including: Society of Manufacturing Engineers (SME) Outstanding Young Engineer Award 1989 Engineering Society of Detroit Leadership Award 1990 Robotic Industry Association, Leadership Award, 1994 SME International Eli Whitney Productivity Award 1997 Kevin. Harding has published over 140 technical papers, taught over 80 short courses and tutorials to industrial and academic audiences as well as been granted over 80 patents.He is the primary author and editor of the CRC Handbook on Optical Dimensional Metrology. He has served as association and conference chair for over 20 years working with the SPIE, LIA, ESD, SME, and OSA and is a fellow and past president of the SPIE .